Session 11-3

Tunable Replica Circuits and Adaptive Voltage-Frequency Techniques for Dynamic Voltage, Temperature, and Aging Variation Tolerance

 

Abstract

Tunable replica circuits are used in conjunction with error-detection sequentials and dynamic voltage and frequency techniques to adapt to voltage, temperature, and aging variations. Measurements on a 45nm test chip demonstrate the delay sensitivity of replica circuits to voltage, temperature, and AC/DC stress and recovery.