Session 11B-4

Highly Reliable 26nm 64Gb MLC E2NAND (Embedded-ECC & Enhanced-efficiency)
Flash Memory with MSP (Memory Signal Processing) Controller

 

Abstract

A highly reliable 26nm 64GB MLC E2NAND (E2: Embedded-ECC & Enhanced-efficiency) flash memory has been successfully developed. To overcome scaling challenges, novel integration and operation technologies, such as 2-dummy word-line (WL) scheme, depletion suppressing process, hydrogen reducing process and Virtual Negative Read (VNR) scheme are introduced. And also, Memory Signal Processing (MSP) controller is used for enhancing performance and reliability. Finally, 5K cycling and 1 year data retention can be greatly achieved.